Interference thickness oscillations of an X-ray wave on periodically profiled silicon

✍ Scribed by Aristov, V. V. ;Winter, U. ;Nikulin, A. Yu. ;Redkin, S. V. ;Snigirev, A. A. ;Zaumseil, P. ;Yunkin, V. A.

• Book ID: 105380726
• Publisher: John Wiley and Sons
• Year: 1988
• Tongue: English
• Weight: 296 KB
• Volume: 108
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2211080222