✦ LIBER ✦
Interfacial X-ray photospectrometry study of In0.53Ga0.47As under different passivation treatments for metal oxide semiconductor field effect transistor devices
✍ Scribed by Mohd Razip Wee, M.F.; Dehzangi, A.; Bollaert, S.; Yeop Majlis, Burhanuddin; Wichmann, N.
- Book ID
- 121801853
- Publisher
- The Institution of Engineering and Technology
- Year
- 2013
- Tongue
- English
- Weight
- 395 KB
- Volume
- 8
- Category
- Article
- ISSN
- 1750-0443
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