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Interfacial water dielectric-permittivity-profile measurements using atomic force microscopy

✍ Scribed by Teschke, O.; Ceotto, G.; de Souza, E. F.

Book ID: 120928471
Publisher: The American Physical Society
Year: 2001
Tongue: English
Weight: 207 KB
Volume: 64
Category: Article
ISSN: 1063-651X
DOI: 10.1103/PhysRevE.64.011605

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Interfacial aqueous solutions dielectric

Interfacial aqueous solutions dielectric constant measurements using atomic force microscopy

✍ O. Teschke; G. Ceotto; E.F. de Souza 📂 Article 📅 2000 🏛 Elsevier Science 🌐 English ⚖ 385 KB

Dielectric constant measurements of inte

Dielectric constant measurements of interfacial aqueous solutions using atomic force microscopy

✍ E.F de Souza; G Ceotto; O Teschke 📂 Article 📅 2001 🏛 Elsevier Science 🌐 English ⚖ 206 KB

Dielectric constant variation at aqueous solution/mica interfaces is shown to be responsible for the force acting on tips immersed in the double layer. The exchange of the volume of a region of the electric double layer of a mica surface immersed in aqueous solutions, with a dielectric constant, by