✦ LIBER ✦
Interfacial Trap Density-of-States in Pentacene- and ZnO-Based Thin-Film Transistors Measured via Novel Photo-excited Charge-Collection Spectroscopy
✍ Scribed by Kimoon Lee; Min Suk Oh; Sung-jin Mun; Kwang H. Lee; Tae Woo Ha; Jae Hoon Kim; Sang-Hee Ko Park; Chi-Sun Hwang; Byoung H. Lee; Myung M. Sung; Seongil Im
- Publisher
- John Wiley and Sons
- Year
- 2010
- Tongue
- English
- Weight
- 682 KB
- Volume
- 22
- Category
- Article
- ISSN
- 0935-9648
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