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Interfacial coherency stress distribution in TiN/AlN bilayer and multilayer films studied by FEM analysis

✍ Scribed by Vipin Chawla; David Holec; Paul H. Mayrhofer


Book ID
116376160
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
769 KB
Volume
55
Category
Article
ISSN
0927-0256

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