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Interface traps density-of-states as a vital component for hot-carrier degradation modeling

✍ Scribed by S.E. Tyaginov; I.A. Starkov; O. Triebl; J. Cervenka; C. Jungemann; S. Carniello; J.M. Park; H. Enichlmair; M. Karner; Ch. Kernstock; E. Seebacher; R. Minixhofer; H. Ceric; T. Grasser


Book ID
108210884
Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
912 KB
Volume
50
Category
Article
ISSN
0026-2714

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