✦ LIBER ✦
Interface trap density in amorphous La2Hf2O7/SiO2high-κgate stacks on Si
✍ Scribed by B. Mereu; A. Dimoulas; G. Vellianitis; G. Apostolopoulos; R. Scholz; M. Alexe
- Book ID
- 106019554
- Publisher
- Springer
- Year
- 2005
- Tongue
- English
- Weight
- 617 KB
- Volume
- 80
- Category
- Article
- ISSN
- 1432-0630
No coin nor oath required. For personal study only.