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Interface states and capacitance-voltage characteristics ofn-SnO2:Ni/p-Si heterostructures under gas-adsorption conditions

✍ Scribed by R. B. Vasil’ev; A. M. Gas’kov; M. N. Rumyantseva; L. I. Ryabova; B. A. Akimov


Book ID
110126629
Publisher
Springer
Year
2001
Tongue
English
Weight
55 KB
Volume
35
Category
Article
ISSN
1063-7826

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