Interface Roughness Fractality Effects on the Electron Mobility in Semiconducting Quantum Wells

✍ Scribed by G. Palasantzas; J. Barnaś; L. J. Geerligs

• Publisher: John Wiley and Sons
• Year: 1998
• Tongue: English
• Weight: 191 KB
• Volume: 209
• Category: Article
• ISSN: 0370-1972
• DOI: 10.1002/(sici)1521-3951(199810)209:2<319::aid-pssb319>3.0.co;2-l