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Interface roughness cross-correlation laws deduced from scattering diagram measurements on optical multilayers: effect of the material grain size

✍ Scribed by Amra, C.; Roche, P.; Pelletier, E.


Book ID
115392773
Publisher
Optical Society of America
Year
1987
Tongue
English
Weight
774 KB
Volume
4
Category
Article
ISSN
0740-3224

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