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Interface layer effect on the stress distribution of a wafer-bonded bilayer structure

โœ Scribed by Yin Zhang

Book ID
106393572
Publisher
Springer
Year
2007
Tongue
English
Weight
437 KB
Volume
43
Category
Article
ISSN
0022-2461

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๐Ÿ“œ SIMILAR VOLUMES

Intensity of the stress singularity at t
Intensity of the stress singularity at the interface corner between a bonded elastic and rigid layer
โœ E.D. Reedy Jr ๐Ÿ“‚ Article ๐Ÿ“… 1990 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 662 KB

A stress singularity of type Kr" (6 < 0) exists at the interface corner between bonded elastic quarter planes. The intensity of this stress singularity, referred to here as the free-edge stress intensity factory K,, characterizes the magnitude of the stress state in the region of the interface corne