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Interface engineering of a ZrO[sub 2]/SiO[sub 2]/Si layered structure by in situ reoxidation and its oxygen-pressure-dependent thermal stability

✍ Scribed by Watanabe, Heiji


Book ID
121661475
Publisher
American Institute of Physics
Year
2001
Tongue
English
Weight
300 KB
Volume
78
Category
Article
ISSN
0003-6951

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