Interface electronic structure of XDTM titanium aluminide composites
β Scribed by D.D. Vvedensky; M.E. Eberhart; L. Christodoulou; S. Crampin; J.M. MacLaren
- Publisher
- Elsevier Science
- Year
- 1990
- Tongue
- English
- Weight
- 638 KB
- Volume
- 126
- Category
- Article
- ISSN
- 0921-5093
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## Abstract This paper gives an account of research which has been carried out on electronβbeam welded specimens made of highβNb Ξ³/Ξ±~2~βtitanium aluminides (in short: TiAl). The high niobium content of this alloy (5β8β%) has a positive effect on the strength and the creep resistance and also on t
Ti-Al 3 Ti laminated composites have been fabricated through reactive sintering in vacuum using Ti and Al foils with different initial thickness. The aluminum layer was completely consumed resulting in microstructures of well-bonded metal-intermetallic layered composites with Ti residual metal layer