Interface defects and induced voltage contrast in SEM studies of bare SiO2-Si systems : K. F. Knott. Solid-State Elect. 31(12), 1667 (1988)

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 94 KB
• Volume: 30
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(90)90038-o