Atomic resolution STEM analysis of defec
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R.F. Klie; Y. Zhu
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Article
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2005
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Elsevier Science
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English
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Atomic resolution scanning transmission electron microscopy (STEM) analysis, in particular the combination of Z-contrast imaging and electron energy-loss spectroscopy (EELS) has been successfully used to measure the atomic and electronic structure of materials with sub-nanometer spatial resolution.