๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Interface defect chemistry of oxide ceramic materials. Unresolved problems

โœ Scribed by Janusz Nowotny


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
665 KB
Volume
49
Category
Article
ISSN
0167-2738

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Atomic resolution STEM analysis of defec
โœ R.F. Klie; Y. Zhu ๐Ÿ“‚ Article ๐Ÿ“… 2005 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 875 KB

Atomic resolution scanning transmission electron microscopy (STEM) analysis, in particular the combination of Z-contrast imaging and electron energy-loss spectroscopy (EELS) has been successfully used to measure the atomic and electronic structure of materials with sub-nanometer spatial resolution.