𝔖 Bobbio Scriptorium
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Interface crack interacting with a microvoid in the near-tip process zone

✍ Scribed by Han Jian-Jun; Chen Yi-Heng


Book ID
110250589
Publisher
Springer Netherlands
Year
2000
Tongue
English
Weight
148 KB
Volume
102
Category
Article
ISSN
1573-2673

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