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Interface-charged impurity scattering in semiconductor MOSFETs and MODFETs: temperature-dependent resistivity and 2D ‘metallic` behavior

✍ Scribed by S.Das Sarma; E.H Hwang; Igor Žutić


Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
76 KB
Volume
27
Category
Article
ISSN
0749-6036

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✦ Synopsis


We present the results on the anomalous 2D transport behavior by employing Drude-Boltzmann transport theory and taking into account the realistic charge impurity scattering effects. Our results show quantitative agreement with the existing experimental data in several different systems and address the origin of the strong and nonmonotonic temperaturedependent resistivity.