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Interface behaviour evaluation in Au/Cr, Au/Ti and Au/Pd/Ti thin films by means of resistivity and stylus measurements

โœ Scribed by R. Audino; G. Destefanis; F. Gorgellino; E. Pollino; S. Tamagno


Publisher
Elsevier Science
Year
1976
Tongue
English
Weight
298 KB
Volume
36
Category
Article
ISSN
0040-6090

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