Interface and electronic characterization of thin epitaxial films

✍ Scribed by C.A.F. Vaz; H.-Q. Wang; C.H. Ahn; V.E. Henrich; M.Z. Baykara; T.C. Schwendemann; N. Pilet; B.J. Albers; U.D. Schwarz; L.H. Zhang; Y. Zhu; J. Wang; E.I. Altman

• Book ID: 108280726
• Publisher: Elsevier Science
• Year: 2009
• Tongue: English
• Weight: 735 KB
• Volume: 603
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/j.susc.2008.11.022