✦ LIBER ✦
Interface and border trap relaxation in Si–SiO2 structures with Ge nanocrystals examined by transient capacitance spectroscopy
✍ Scribed by R. Beyer; J. von Borany; H. Burghardt
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 322 KB
- Volume
- 86
- Category
- Article
- ISSN
- 0167-9317
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