✦ LIBER ✦
Interface Analysis of Embedded Chip Resistor Device Package and Its Effect on Drop Shock Reliability
✍ Scribed by Park, Se-Hoon; Kim, Sun Kyoung; Kim, Young-Ho
- Book ID
- 111904791
- Publisher
- American Scientific Publishers
- Year
- 2012
- Tongue
- English
- Weight
- 983 KB
- Volume
- 12
- Category
- Article
- ISSN
- 1533-4880
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