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Interest of the ordered subsets expectation maximization (OS-EM) algorithm in pinhole single-photon emission tomography reconstruction: a phantom study

✍ Scribed by Christian Vanhove; Michel Defrise; Philippe R. Franken; Hendrik Everaert; Frank Deconinck; Axel Bossuyt


Publisher
Springer
Year
2000
Tongue
English
Weight
267 KB
Volume
27
Category
Article
ISSN
0340-6997

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