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Interdissolution kinetics in oxide powder mixture using high-temperature X-ray diffraction technique

✍ Scribed by A. Jakobsson; Du Sichen; S. Seetharaman

Book ID
112935986
Publisher
The Minerals, Metals & Materials Society
Year
1996
Tongue
English
Weight
450 KB
Volume
27
Category
Article
ISSN
1543-1916

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## Abstract The results of a study of oxide precipitates in Czochralski (CZ) grown silicon using two X‐ray diffraction methods are reported. The diffuse scattering around the Bragg diffraction maxima was measured on a series of samples after various two‐stage annealing treatment. Combining the anal