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Interdisciplinary surface studies on porous Si(PSi)—I. Elastic peak electron spectroscopy (EPES), valence band XPS and atomic force microscopy (AFM)

✍ Scribed by B Gruzza; L Bideux; C Robert; G Salace; E Vázsonyi; G Petô; L Guczi; G Gergely


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
358 KB
Volume
46
Category
Article
ISSN
0042-207X

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