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Interdiffusion, phase formation, and stress development in Cu–Pd thin-film diffusion couples: Interface thermodynamics and mechanisms

✍ Scribed by Chakraborty, J.; Welzel, U.; Mittemeijer, E. J.


Book ID
121847832
Publisher
American Institute of Physics
Year
2008
Tongue
English
Weight
574 KB
Volume
103
Category
Article
ISSN
0021-8979

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