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Interaction of Au on Si(100) studied by core level binding energy shifts

✍ Scribed by Z.H. Lu; T.K. Sham; P.R. Norton


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
285 KB
Volume
85
Category
Article
ISSN
0038-1098

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X-ray photoelectron spectroscopy has been used to study 20, 100 and 1000 nm evaporated cerium oxide films on Si(100) single-crystal wafers. Upon exposure to the x-ray source there was loss of oxygen and generation of Ce3+. Furthermore, for the 20 nm coating, there was evidence of a shift to higher b