𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Interaction forces between a tungsten tip and methylated SiO2 surfaces studied with scanning force microscopy

✍ Scribed by L. Olsson; P. Tengvall; R. Wigren; R. Erlandsson


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
518 KB
Volume
42-44
Category
Article
ISSN
0304-3991

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Interaction between a dielectric tip and
✍ D. Van Labeke; B. Labani; C. Girard πŸ“‚ Article πŸ“… 1989 πŸ› Elsevier Science 🌐 English βš– 402 KB

We present a model for calculating the interaction energy of an ionic crystal and a spherical dielectric tip, applicable to experiments in scanning force microscopy. The repulsive energy is introduced by performing a pairwise summation between the atoms ofthe probe and each atom of the substrate. Th

Reliability of SiO2 and high-k gate insu
✍ M. Porti; L. Aguilera; X. Blasco; M. NafrΔ±Β΄a; X. Aymerich πŸ“‚ Article πŸ“… 2007 πŸ› Elsevier Science 🌐 English βš– 357 KB

In this work, a conductive atomic force microscope (C-AFM) is used to study the reliability (degradation and breakdown, BD) of SiO 2 and high-k dielectrics. The effect of a current limit on the post-BD SiO 2 electrical properties at the nanoscale is discussed. In particular, the impact of a current