๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

INTENSITY INTEGRATION TECHNIQUE FOR CONTOURING TWO-DIMENSIONAL REFLECTIVE SURFACES

โœ Scribed by G. Subramanian; P. Ramana Kumar


Book ID
111371889
Publisher
John Wiley and Sons
Year
2006
Tongue
English
Weight
462 KB
Volume
30
Category
Article
ISSN
0732-8818

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


TEM techniques for two dimensional junct
โœ A. Romano; J. Vanhellemont; J.R. Morante; W. Vandervorst ๐Ÿ“‚ Article ๐Ÿ“… 1989 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 212 KB

The packing density of integrated circuits is increasing continuously accompanied by a reduction of the effective size of its components (transistors, resistors and others), not only lateral but also in depth. In the case of the transistorsvery shallow junctions have to be fabricated. A tight contro

A simple reflection-type two-dimensional
โœ Youngchun Youk; Dug Young Kim ๐Ÿ“‚ Article ๐Ÿ“… 2006 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 292 KB

We report a new configuration of a reflection-type confocal scanning optical microscope system for measuring the refractive index profile of an optical waveguide. Several improvements on the earlier design are proposed; a light emitting diode at 650 nm wavelength instead of a laser diode or He-Ne la