๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Intensity factors for subinterface cracks in dissimilar anisotropic piezoelectric media

โœ Scribed by H. G. Beom; K. M. Jeong; Y. H. Kim


Publisher
Springer
Year
2003
Tongue
English
Weight
326 KB
Volume
73
Category
Article
ISSN
0939-1533

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Near-tip fields and intensity factors fo
โœ H. G. Beom; S. N. Atluri ๐Ÿ“‚ Article ๐Ÿ“… 1996 ๐Ÿ› Springer Netherlands ๐ŸŒ English โš– 987 KB

A complete form of stress and electric displacement fields in the vicinity of the tip of an interfacial crack, between two dissimilar anisotropic piezoelectric media, is derived by using the complex function theory. New definitions of real-valued stress and electric displacement intensity factors fo

Efficient boundary element analysis of s
โœ Yuuki Ryoji; Cho Sang-Bong ๐Ÿ“‚ Article ๐Ÿ“… 1989 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 889 KB

The stress intensity factors of an interface crack in dissimilar materials are clarified and an extrapolation method to determine the stress intensity factors of an interface crack is proposed. The BEM using Hetenyi's fundamental solution is applied to crack problems in dissimilar materials and vari