Integration of two different gate oxide thicknesses in a 0.6-μm dual voltage mixed signal CMOS process

✍ Scribed by O, K.K.; Yasaitis, J.

• Book ID: 114535995
• Publisher: IEEE
• Year: 1995
• Tongue: English
• Weight: 342 KB
• Volume: 42
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.370017