𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Integration of imaging and analysis capabilities in the scanning electron microscope

✍ Scribed by J.P. Martin; G. Jenkinson; W. Malkusch

Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
93 KB
Volume
19
Category
Article
ISSN
0304-3991

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Environmental scanning electron microsco
Environmental scanning electron microscope imaging examples related to particle analysis
✍ Scott A. Wight; Cynthia J. Zeissler πŸ“‚ Article πŸ“… 1993 πŸ› John Wiley and Sons 🌐 English βš– 613 KB

## Abstract This work provides examples of some of the imaging capabilities of environmental scanning electron microscopy applied to easily charged samples relevant to particle analysis. Environmental SEM (also referred to as high pressure or low vacuum SEM) can address uncoated samples that are kn

An introduction to process visualization
An introduction to process visualization capabilities and considerations in the environmental scanning electron microscope (ESEM)
✍ Edward R. Prack πŸ“‚ Article πŸ“… 1993 πŸ› John Wiley and Sons 🌐 English βš– 668 KB

Process visualization can be a very powerful tool for understanding dynamic processes. Process visualization requires a non-destructive technique that can be monitored in real time. In this paper various methods of non-destructive inspection will be described and compared. The applicability of these

Atomic scale defect analysis in the scan
Atomic scale defect analysis in the scanning transmission electron microscope
✍ Ilke Arslan; Nigel D. Browning πŸ“‚ Article πŸ“… 2006 πŸ› John Wiley and Sons 🌐 English βš– 994 KB

## Abstract Z‐contrast imaging and electron energy loss spectroscopy in the scanning transmission electron microscope provide the ability to investigate the structure–composition–property relationship at individual defects on the atomic scale. In this article, the main principles behind the techniq