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Integrating Phase-Change Memory Cell With Ge Nanowire Diode for Crosspoint Memory—Experimental Demonstration and Analysis

✍ Scribed by SangBum Kim; Yuan Zhang; McVittie, J.P.; Jagannathan, H.; Nishi, Y.; Wong, H.-S.P.


Book ID
114619516
Publisher
IEEE
Year
2008
Tongue
English
Weight
754 KB
Volume
55
Category
Article
ISSN
0018-9383

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