Integrating Circuit Level Simulation and Monte-Carlo Radiation Transport Code for Single Event Upset Analysis in SEU Hardened Circuitry

✍ Scribed by Warren, Kevin M.; Sternberg, Andrew L.; Weller, Robert A.; Baze, Mark P.; Massengill, Lloyd W.; Reed, Robert A.; Mendenhall, Marcus H.; Schrimpf, Ronald D.

• Book ID: 120193081
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 556 KB
• Volume: 55
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2008.2006481