Integrated estimation of measurement error with empirical process modeling—A hierarchical Bayes approach

✍ Scribed by Hongshu Chen; Bhavik R. Bakshi; Prem K. Goel

• Publisher: American Institute of Chemical Engineers
• Year: 2009
• Tongue: English
• Weight: 624 KB
• Volume: 55
• Category: Article
• ISSN: 0001-1541
• DOI: 10.1002/aic.11918