𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Integrated data envelopment analysis and neural network model for forecasting performance of wafer fabrication operations

✍ Scribed by Chia-Yu Hsu


Book ID
120675666
Publisher
Springer US
Year
2013
Tongue
English
Weight
609 KB
Volume
25
Category
Article
ISSN
0956-5515

No coin nor oath required. For personal study only.