𝔖 Bobbio Scriptorium

✦ LIBER ✦

Integrated circuit quality and reliability: Author: Eugene R. Hnatek Publishers: Marcel Dekker, Inc., 270, Madison Avenue, New York, New York 10016, United States of America. (ISBN-0-8247-7668-2). (1987)

✍ Scribed by G.W.A.D

Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 39 KB
Volume: 28
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(88)90402-7

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