Integrated circuit production yield assurance based on yield analysis : Z. Stamenkovic et al. Microelectronics Journal, 24, 819 (1993)

• Book ID: 103287933
• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 212 KB
• Volume: 34
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(94)90311-5