Instrumentation developments for production and characterisation of Inverse Compton Scattering X-rays and first results with a 17 MeV electron beam

✍ Scribed by A.S. Chauchat; V. Le Flanchec; J.P. Nègre; A. Binet; P. Balleyguier; J.P. Brasile; J.M. Ortega

• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 1015 KB
• Volume: 622
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/j.nima.2010.07.034