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Instrumentation and Measurement Issues for Nanometer Particles: Workshop Summary

โœ Scribed by D.Y.H. Pui; J.R. Brock; D.-R. Chen; H. Fissan; C.D. Frisbie; C.E. Lyman; J.C. Miller; G.W. Mulholland; R. Pecora; O. Preining; T. Vo-Dinh


Book ID
110285122
Publisher
Springer Netherlands
Year
2000
Tongue
English
Weight
44 KB
Volume
2
Category
Article
ISSN
1388-0764

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