✦ LIBER ✦
Instrument for thickness measurement of transparent thin films on silicon substrates : M. Sandera. TESLA Electron., 3 (1972), p. 85
- Publisher
- Elsevier Science
- Year
- 1973
- Tongue
- English
- Weight
- 112 KB
- Volume
- 12
- Category
- Article
- ISSN
- 0026-2714
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