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[Institute of Electrical and Electronics Engineers 1975 IEEE International Solid-State Circuits Conference - Philadelphia, PA, USA (February 1975)] 1975 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - A lumped-modeling approach for TRAPATT diodes and external circuit analysis

✍ Scribed by Obah, C.; Mitchell, R.; Penstone, S.

Book ID: 115468131
Publisher: Institute of Electrical and Electronics Engineers
Year: 1975
Weight: 760 KB
Volume: XVIII
Category: Article
DOI: 10.1109/isscc.1975.1155430

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