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Instability evolution within a-SiNx film assessed through MIS structure under bias and temperature stresses

✍ Scribed by Orhan Özdemir; İsmail Atılgan; Bayram Katırcıoğlu


Book ID
117145363
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
229 KB
Volume
296
Category
Article
ISSN
0022-3093

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