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[Inst. Electr. Eng. Japan International Symposium on Power Semiconductor Devices and IC's: ISPSD '95 - Yokohama, Japan (23-25 May 1995)] Proceedings of International Symposium on Power Semiconductor Devices and IC's: ISPSD '95 - The soot deposited integrated circuit substrate of 6 inches diameter for high voltage ICs, improved in durability against the pressure cooker test

โœ Scribed by Anno, T.; Katsuki, S.; Unno, H.; Yokota, M.; Sawada, R.; Fujii, I.; Shimizu, M.


Book ID
126745097
Publisher
Inst. Electr. Eng. Japan
Year
1995
Weight
390 KB
Category
Article
ISBN-13
9780780326187

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