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[Inst. Electr. Eng. Japan International Symposium on Power Semiconductor Devices and IC's: ISPSD '95 - Yokohama, Japan (23-25 May 1995)] Proceedings of International Symposium on Power Semiconductor Devices and IC's: ISPSD '95 - Investigation on the long term reliability of power IGBT modules

✍ Scribed by Wuchen Wu, ; Held, M.; Jacob, P.; Scacco, P.; Birolini, A.

Book ID: 126249489
Publisher: Inst. Electr. Eng. Japan
Year: 1995
Weight: 839 KB
Category: Article
ISBN-13: 9780780326187
DOI: 10.1109/ISPSD.1995.515079

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