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[Inst. Electr. Eng. Japan 1995 International Symposium on Electrical Insulating Materials - Tokyo, Japan (17-20 Sept. 1995)] Proceedings of 1995 International Symposium on Electrical Insulating Materials - Electrical conduction and breakdown in amorphous tantalum and niobium oxide films

✍ Scribed by Khanin, S.D.

Book ID: 120003041
Publisher: Inst. Electr. Eng. Japan
Year: 1995
Tongue: Japanese
Weight: 220 KB
Category: Article
ISBN-13: 9784886860477
DOI: 10.1109/ISEIM.1995.496517

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