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Inspection of defects in conductive multi-layered structures by an eddy current scanning technique: Simulation and experiments

✍ Scribed by Pingjie Huang; Guangxin Zhang; Zhaotong Wu; Jinhui Cai; Zekui Zhou


Book ID
108218602
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
643 KB
Volume
39
Category
Article
ISSN
0963-8695

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