Insights into the origin of threading dislocations in GaN∕Al[sub 2]O[sub 3] from atomic force microscopy

✍ Scribed by Oliver, Rachel A.; Kappers, Menno J.; Humphreys, Colin J.

• Book ID: 120304593
• Publisher: American Institute of Physics
• Year: 2006
• Tongue: English
• Weight: 513 KB
• Volume: 89
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.2219747