Insights into the mechanisms of light-induced degradation from studies of defects in low Ge fraction a-Si,Ge:H alloys

✍ Scribed by J.David Cohen; Jennifer Heath; Kimon Palinginis; Jeffrey C Yang; Subhendu Guha

• Book ID: 117145634
• Publisher: Elsevier Science
• Year: 2002
• Tongue: English
• Weight: 204 KB
• Volume: 299-302
• Category: Article
• ISSN: 0022-3093
• DOI: 10.1016/s0022-3093(01)01172-3