Insight Into the Aggravated Lifetime Reliability in Advanced MOSFETs With Strained-Si Channels on SiGe Strain-Relaxed Buffers Due to Self-Heating

✍ Scribed by Agaiby, R.; O'Neill, A.G.; Olsen, S.H.; Eneman, G.; Verheyen, P.; Loo, R.; Claeys, C.

• Book ID: 114619414
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 476 KB
• Volume: 55
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2008.921994