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Inhomogeneous deformation of silicon surface layers probed by second-harmonic generation in reflection

✍ Scribed by Govorkov, S. V.; Emel'yanov, V. I.; Koroteev, N. I.; Petrov, G. I.; Shumay, I. L.; Yakovlev, V. V.; Khokhlov, R. V.

No coin nor oath required. For personal study only.

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